Bulletin of the American Physical Society
APS March Meeting 2016
Volume 61, Number 2
Monday–Friday, March 14–18, 2016; Baltimore, Maryland
Session X7: Dopants and Defects in Semiconductors: Compound Semiconductors
8:00 AM–10:24 AM,
Friday, March 18, 2016
Room: 303
Sponsoring
Units:
DMP FIAP
Chair: Christophe Boehme, University of Utah
Abstract ID: BAPS.2016.MAR.X7.11
Abstract: X7.00011 : Grain boundaries and surfaces in polycrystalline photovoltaics
10:00 AM–10:12 AM
Preview Abstract Abstract
Authors:
Paul Haney
(National Institude of Standards and Technology)
Heayoung Yoon
(The University of Utah)
Nikolai Zhitenev
(National Institude of Standards and Technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2016.MAR.X7.11
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