Bulletin of the American Physical Society
APS March Meeting 2016
Volume 61, Number 2
Monday–Friday, March 14–18, 2016; Baltimore, Maryland
Session L7: Dopants and Defects in Semiconductors: Novel experimental techniques
11:15 AM–2:15 PM,
Wednesday, March 16, 2016
Room: 303
Sponsoring
Units:
DMP FIAP
Chair: James Speck, University of California, Santa Barbara
Abstract ID: BAPS.2016.MAR.L7.4
Abstract: L7.00004 : Modification of a scanning electron microscope (SEM) for insitu, nanometer size contact, electrical measurements of III-nitride transistors
12:15 PM–12:27 PM
Preview Abstract Abstract
Authors:
Camelia Selcu
(Department of Physics, The Ohio State University)
Zhichao Yang
(Department of Electrical and Computer Engineering, The Ohio State University)
Sriram Krishnamoorthy
(Department of Electrical and Computer Engineering, The Ohio State University)
Siddharth Rajan
(Department of Electrical and Computer Engineering, The Ohio State University)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2016.MAR.L7.4
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