Wednesday, March 16, 2016
8:00AM - 8:12AM
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K46.00001: The influence of deformation rate on polymer nanomechanical properties as measured by Atomic Force Microscopy.
Bede Pittenger, Thomas Mueller
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Wednesday, March 16, 2016
8:12AM - 8:24AM
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K46.00002: Atomic Force Tomography of a Nonplanar Molecule: Role of Lateral and Chemical Sample-Tip Interactions
Xianghua Kong, Wei Ji
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Wednesday, March 16, 2016
8:24AM - 8:36AM
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K46.00003: Scanning Ion Conductance Microscopy for living cell membrane potential measurement
Namuna Panday
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Wednesday, March 16, 2016
8:36AM - 8:48AM
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K46.00004: Local Imaging of Conductance Evolution in Ion-Gel-Gated Transitional Metal Dichalcoginide Transistors
Xiaoyu Wu, Di Wu, Hongtao Yuan, Harold Hwang, Yi Cui, Keji Lai
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Wednesday, March 16, 2016
8:48AM - 9:00AM
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K46.00005: Resolving local voltage variations in opto-electronic devices with Kelvin probe force microscopy
Elizabeth Tennyson, Joseph Garrett, Jeremy Munday, Marina Leite
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Wednesday, March 16, 2016
9:00AM - 9:12AM
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K46.00006: Multi-step atomic interchange mechanism for atom manipulation on semiconductor surfaces.
Batnyam Enkhtaivan, Atsushi Oshiyama
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Wednesday, March 16, 2016
9:12AM - 9:48AM
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K46.00007: Measuring electron-phonon coupling with Scanning Tunneling Microscopy
Invited Speaker:
Vidya Madhavan
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Wednesday, March 16, 2016
9:48AM - 10:00AM
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K46.00008: Lateral manipulation and interplay of local Kondo resonances in a two-impurity Kondo system.
Haiming Guo
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Wednesday, March 16, 2016
10:00AM - 10:12AM
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K46.00009: Local Force Interactions and Image Contrast Reversal on Graphite Observed with Noncontact Atomic Force Microscopy
Omur Dagdeviren, Jan Goetzen, Eric Altman, Udo Schwarz
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Wednesday, March 16, 2016
10:12AM - 10:24AM
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K46.00010: \textbf{Theoretical model of the tunneling current between a metallic tip and a ferroelectric material.}
Ravi Neupane, Andrew Yost, TeYu Chien
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Wednesday, March 16, 2016
10:24AM - 10:36AM
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K46.00011: The power laws of nanoscale forces in ambient conditions
Matteo Chiesa, Sergio Santos, Chia-Yun Lai
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Wednesday, March 16, 2016
10:36AM - 10:48AM
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K46.00012: Development of tip Scanning High Speed AFM operating at 1,000 Lines/s {\&} 15\textmu m
Umit Celik, Ihsan Kehribar, Kubra Celik, H. Özgür Özer, Ahmet Oral
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