Bulletin of the American Physical Society
APS March Meeting 2016
Volume 61, Number 2
Monday–Friday, March 14–18, 2016; Baltimore, Maryland
Session F46: Instrumentation III: Scattering, Diffraction, Imaging
11:15 AM–2:15 PM,
Tuesday, March 15, 2016
Room: 311
Sponsoring
Unit:
GIMS
Chair: Dennis Mills, Argonne National Laboratory
Abstract ID: BAPS.2016.MAR.F46.14
Abstract: F46.00014 : Dark-Field Scanning Transmission Ion Microscopy \textit{via} Direct Detection of Transmitted Helium Ions with a Multichannel Plate
1:51 PM–2:03 PM
Preview Abstract Abstract
Authors:
Taylor Woehl
(Material Measurement Laboratory, National Institute of Standards and Technology)
Ryan White
(Material Measurement Laboratory, National Institute of Standards and Technology)
Robert Keller
(Material Measurement Laboratory, National Institute of Standards and Technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2016.MAR.F46.14
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