Tuesday, March 15, 2016
8:00AM - 8:12AM
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E46.00001: Towards microwave imaging of single two-level defects in dielectric materials
Sebastian de Graaf, Andrey Danilov, Alexander Tzalenchuk, Sergey Kubatkin
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Tuesday, March 15, 2016
8:12AM - 8:24AM
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E46.00002: Advances in imaging and quantification of electrical properties at the nanoscale using Scanning Microwave Impedance Microscopy (sMIM)
stuart friedman, Fred Stanke, Yongliang Yang, Oskar Amster
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Tuesday, March 15, 2016
8:24AM - 8:36AM
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E46.00003: Magnetic resonance force detection using a membrane resonator
Nicolas Scozzaro, William Ruchotzke, Amanda Belding, Jeremy Cardellino, Erick Blomberg, Brendan McCullian, Vidya Bhallamudi, Denis Pelekhov, P. Chris Hammel
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Tuesday, March 15, 2016
8:36AM - 8:48AM
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E46.00004: Dipolar Decoupling in Magnetic Resonance Force Microscopy using Optimal Control Pulses
William Rose, Holger Haas, Raffi Budakian
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Tuesday, March 15, 2016
8:48AM - 9:00AM
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E46.00005: Force-Detected Magnetic Resonance Imaging in Micron-Scale Liquids
Aimee Sixta, Sophia Bogat, Diego Wright, Shirin Mozaffari, Daniel Tennant, Jeremy Paster, John Markert
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Tuesday, March 15, 2016
9:00AM - 9:12AM
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E46.00006: Time-Resolved SQUID Sensor with a Nyquist Frequency up to 25 GHz
Z. Cui, Y. H. Wang, P. Kratz, A. J. Rosenberg, C. A. Watson, I. Sochnikov, Y.-K.-K. Fung, G. Gibson, J. R. Kirtley, M. B. Ketchen, K. A. Moler
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Tuesday, March 15, 2016
9:12AM - 9:48AM
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E46.00007: Toward single atom qubits on a surface: Pump-probe spectroscopy and electrically-driven spin resonance
Invited Speaker:
William Paul
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Tuesday, March 15, 2016
9:48AM - 10:00AM
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E46.00008: Cantilever detection of electron spin resonance in the terahertz region
Hideyuki Takahashi, Eiji Ohmichi, Hitoshi Ohta
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Tuesday, March 15, 2016
10:00AM - 10:12AM
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E46.00009: Ultrafast nano-imagining of the photoinduced phase transition dynamics in VO$_{\mathrm{2}}$
Sven A. Doenges, Omar Khatib, Brian T. O'Callahan, Joanna M. Atkin, Jae Hyung Park, David H. Cobden, Markus B. Raschke
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Tuesday, March 15, 2016
10:12AM - 10:24AM
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E46.00010: Nanoscale dynamics of the Insulator-to-Metal transition in VO$_{2}$
Aaron Sternbach
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Tuesday, March 15, 2016
10:24AM - 10:36AM
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E46.00011: s-SNOM based IR and THz spectroscopy for nanoscale material characterization
Tobias Gokus, Andreas Huber, Adrian Cernescu
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Tuesday, March 15, 2016
10:36AM - 10:48AM
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E46.00012: Novel combination of near-field s-SNOM microscopy with peak-force tapping for nano-chemical and nano-mechanical material characterization with sub-20 nm spatial resolution
Martin Wagner, Karina Carneiro, Stefan Habelitz, Thomas Mueller
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Tuesday, March 15, 2016
10:48AM - 11:00AM
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E46.00013: Towards optically-integrated scanning tunneling microscopy studies of defects in semiconductors
Anne Benjamin, Evan Lang, Kevin Werner, Enam Chowdhury, Jay Gupta
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