Bulletin of the American Physical Society
APS March Meeting 2014
Volume 59, Number 1
Monday–Friday, March 3–7, 2014; Denver, Colorado
Session T24: Focus Session: Advances in Scanned Probe Microscopy III: Scanning Probes Spectroscopic Techniques
11:15 AM–2:15 PM,
Thursday, March 6, 2014
Room: 504
Sponsoring
Unit:
GIMS
Chair: Duming Zhang, National Institute of Standards and Technology
Abstract ID: BAPS.2014.MAR.T24.2
Abstract: T24.00002 : MultiProbe Electrical Measurements of Carbon Nanotubes With On-line Raman Scattering
11:51 AM–12:03 PM
Preview Abstract Abstract
Authors:
Dalia Yablon
(SurfaceChar)
Talia Yeshua
(Hebrew University)
Christian Lehmann
(Hebrew University)
Stephanie Reich
(Free University of Berlin)
Kristin Strain
(University of Edinburgh)
Eleano Campbell
(University of Edinburgh)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2014.MAR.T24.2
Follow Us |
Engage
Become an APS Member |
My APS
Renew Membership |
Information for |
About APSThe American Physical Society (APS) is a non-profit membership organization working to advance the knowledge of physics. |
© 2024 American Physical Society
| All rights reserved | Terms of Use
| Contact Us
Headquarters
1 Physics Ellipse, College Park, MD 20740-3844
(301) 209-3200
Editorial Office
100 Motor Pkwy, Suite 110, Hauppauge, NY 11788
(631) 591-4000
Office of Public Affairs
529 14th St NW, Suite 1050, Washington, D.C. 20045-2001
(202) 662-8700