Synchrotron X-ray Optics Testing at Beamline 1-BM at the Advanced Photon Source

Beamline 1-BM at the Advanced Photon Source has been reconfigured, in part for testing of synchrotron optics with both monochromatic and white beams. Monochromatic energies between 6 and 30 keV are available. Primary agendas include both white beam and monochromatic beam topography, Talbot grating interferometry for measurement of coherence lengths and wavefronts, and micro-focusing. Recent examples will include topography of sapphire , tests of Kirkpatrick-Baez mirrors, and tests of multilayer Laue lenses. Analyzers for Inelastic X-ray Scattering has also been characterized by two user groups.

*Supported from U.S. DOE, Office of Science, Contract No. DE-AC-02-06CH11357.

To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2014.MAR.Z24.1

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Bulletin of the American Physical Society

APS March Meeting 2014

Volume 59, Number 1

Monday–Friday, March 3–7, 2014; Denver, Colorado

Session Z24: Neutron, Light, and X-ray Optics and Sources

Abstract: Z24.00001 : Synchrotron X-ray Optics Testing at Beamline 1-BM at the Advanced Photon Source*

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