Scanned Spin-Precession Microscopy: Progress towards cantilever based approach*

The principal spin microscopy tools for spintronic materials are primarily based on optical detection and are thereby limited to certain materials. There is a need for imaging tools that can address a wider range of materials. Towards this end we recently developed Scanned Spin-Precession Microscopy [1, 2], where we demonstrated the ability to extract local spin properties from a spatially-averaged signal. This is enabled by the modification of the precessional behavior of the spins in a small region by the strongly inhomogeous magnetic field from a micromagnetic probe. We will discuss this novel imaging tool and our recent efforts towards a cantilever-based approach for wider applicability, especially for electrical spin-based devices.\\[4pt] [1] V. P. Bhallamudi et.al., PRL 111, 117201 (2013).\\[0pt] [2] V. P. Bhallamudi et.al., JAP. 111, 013902 (2012)