Temperature Dependence of the Raman Spectra of Mechanically Exfoliated Monolayer MoS$_{2}$

We investigated the temperature dependence of the E$^{1}_{\mathrm{2g}}$ and A$_{\mathrm{1g}}$ peaks in the Raman spectra of monolayer MoS$_{2}$ prepared by mechanical exfoliation (ME) onto Si/SiO$_{2}$ substrates. Micro-Raman spectroscopy was carried out using the 532 nm laser excitation over the temperature range from 30 to 175 $^{\circ}$C. Extracted values of the temperature coefficient for these modes will be presented in conjunction with the effect of excessive laser power on these measurements. These results suggest power densities as low as $\approx $ 275 $\mu $W/$\mu $m$^{2}$ can still cause local heating in ME-MoS$_{2}$ monolayer samples.