Bulletin of the American Physical Society
APS March Meeting 2013
Volume 58, Number 1
Monday–Friday, March 18–22, 2013; Baltimore, Maryland
Session U46: Focus Session: Advances in Scanned Probe Microscopy 2: High Frequencies and Optical Techniques
11:15 AM–2:15 PM,
Thursday, March 21, 2013
Hilton Baltimore
Room: Holiday Ballroom 5
Sponsoring
Unit:
GIMS
Chair: Robert McMichael, NIST
Abstract ID: BAPS.2013.MAR.U46.7
Abstract: U46.00007 : Measurement of optical force in plasmonic resonant cavities using dynamic mode AFM
12:51 PM–1:03 PM
Preview Abstract Abstract
Authors:
Dongshi Guan
(Department of Physics, The Hong Kong University of Science and Technology (HKUST))
Zhihong Hang
(Department of Physics, The Hong Kong University of Science and Technology (HKUST))
Zsolt Marcet
(Department of Physics, University of Florida)
Hui Liu
(Department of Physics, Nanjing University)
Ivan Kravchenko
(Center for Nanophase Materials Sciences, Oak Ridge National Laboratory)
Cheting Chan
(Department of Physics, HKUST*)
Hobun Chan
(Department of Physics, HKUST*)
Penger Tong
(Department of Physics, HKUST*)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2013.MAR.U46.7
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