Bulletin of the American Physical Society
APS March Meeting 2012
Volume 57, Number 1
Monday–Friday, February 27–March 2 2012; Boston, Massachusetts
Session W11: Focus Session: Graphene Structure, Stacking, Interactions: Local Probes and Microscopy
11:15 AM–2:15 PM,
Thursday, March 1, 2012
Room: 210B
Sponsoring
Unit:
DMP
Chair: Phillip First, Georgia Institue of Technology
Abstract ID: BAPS.2012.MAR.W11.6
Abstract: W11.00006 : Scanned probe studies of dielectric screening and charge puddles in epitaxial graphene on SiC(0001)
12:15 PM–12:27 PM
Preview Abstract Abstract
Authors:
A.E. Curtin
(National Institute of Standards and Technology, Boulder, CO)
A. Imtiaz
(National Institute of Standards and Technology, Boulder, CO)
T.M. Wallis
(National Institute of Standards and Technology, Boulder, CO)
P. Kabos
(National Institute of Standards and Technology, Boulder, CO)
R.L. Myers-Ward
(U.S. Naval Research Laboratory, Code 6880, Washington, DC 20375)
C.R. Eddy, Jr.
(U.S. Naval Research Laboratory, Code 6880, Washington, DC 20375)
L.O. Nyakiti
(U.S. Naval Research Laboratory, Code 6880, Washington, DC 20375)
V.D. Wheeler
(U.S. Naval Research Laboratory, Code 6880, Washington, DC 20375)
D.K. Gaskill
(U.S. Naval Research Laboratory, Code 6880, Washington, DC 20375)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.MAR.W11.6
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