Bulletin of the American Physical Society
APS March Meeting 2012
Volume 57, Number 1
Monday–Friday, February 27–March 2 2012; Boston, Massachusetts
Session L5: Focus Session: Interfaces in Complex Oxides - Nickelates
2:30 PM–5:30 PM,
Tuesday, February 28, 2012
Room: 206A
Sponsoring
Unit:
DMP
Chair: John Freeland, Argonne National Laboratory
Abstract ID: BAPS.2012.MAR.L5.8
Abstract: L5.00008 : \textit{in situ} studied correlated oxide LaNiO$_{3}$ ultra thin film by angle resolved photoemission spectroscopy
3:54 PM–4:06 PM
Preview Abstract Abstract
Authors:
H.K. Yoo
(Seoul National University)
Y.J. Chang
(Advanced Light Source (ALS), LBNL \& Fritz-Haber-Institut)
K.S. Kim
(Advanced Light Source (ALS), LBNL)
L. Moreschini
(Advanced Light Source (ALS), LBNL)
D.W. Jeong
(Seoul National University)
Y.S. Kim
(Seoul National University)
A. Bostwick
(Advanced Light Source (ALS), LBNL)
E. Rotenberg
(Advanced Light Source (ALS), LBNL)
T.W. Noh
(Seoul National University)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.MAR.L5.8
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