Bulletin of the American Physical Society
APS March Meeting 2012
Volume 57, Number 1
Monday–Friday, February 27–March 2 2012; Boston, Massachusetts
Session H24: Electrical and Thermal Properties of Semiconductors
8:00 AM–11:00 AM,
Tuesday, February 28, 2012
Room: 256
Sponsoring
Unit:
FIAP
Chair: Michael Manfra, Purdue University
Abstract ID: BAPS.2012.MAR.H24.14
Abstract: H24.00014 : Raman Spectroscopy and Scanning Electron Microscopy of the Bismuth Sillenites Bi$_{25}$InO$_{39}$ and Bi$_{25}$FeO$_{39}$*
10:36 AM–10:48 AM
Preview Abstract Abstract
Authors:
Daniel J. Arenas
(University of North Florida)
Theo Jegorel
(University of North Florida)
Lev Gasparov
(University of North Florida)
Hideo Kohno
(Osaka University)
Catalin Martin
(University of Florida)
David B. Tanner
(University of Florida)
Michael W. Lufaso
(University of North Florida)
*Work at UNF was supported by NSF under Grant No. DMR-0805073. Work at UF was supported by the US DOE through contract DE-FG02-02ER45984.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.MAR.H24.14
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