Bulletin of the American Physical Society

APS March Meeting 2011

Volume 56, Number 1

Monday–Friday, March 21–25, 2011; Dallas, Texas

Session Index

Session X5: The Corporate Feel: Atomic Force Microscopy in Industry	Show Abstracts
Sponsoring Units: FIAP Chair: Jason Cleveland, Asylum Research Room: Ballroom C1

Thursday, March 24, 2011 2:30PM - 3:06PM		X5.00001: Accelerated design and quality control of impact modifiers for plastics through atomic force microscopy (AFM) analysis Invited Speaker: Preview Abstract
Thursday, March 24, 2011 3:06PM - 3:42PM		X5.00002: Scanning Probe Evaluation of Electronic, Mechanical and Structural Material Properties Invited Speaker: Preview Abstract
Thursday, March 24, 2011 3:42PM - 4:18PM		X5.00003: Nanomechanical characterization of polypropylene-based materials with multifrequency atomic force microscopy (AFM)-based methods Invited Speaker: Preview Abstract
Thursday, March 24, 2011 4:18PM - 4:54PM		X5.00004: Probing Photovoltaic Performance Invited Speaker: Preview Abstract
Thursday, March 24, 2011 4:54PM - 5:30PM		X5.00005: Challenges and opportunities for probe-based information technology Invited Speaker: Preview Abstract

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Bulletin of the American Physical Society

APS March Meeting 2011

Volume 56, Number 1

Monday–Friday, March 21–25, 2011; Dallas, Texas

Session Index

Session X5: The Corporate Feel: Atomic Force Microscopy in Industry

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