Bulletin of the American Physical Society

APS March Meeting 2011

Volume 56, Number 1

Monday–Friday, March 21–25, 2011; Dallas, Texas

Session Index

Session X21: Focus Session: Novel X-Ray Instrumentation and Measurement Techniques	Show Abstracts
Sponsoring Units: GIMS Chair: Albert Macrander, Argonne National Laboratory Room: D161

Thursday, March 24, 2011 2:30PM - 3:06PM		X21.00001: Inelastic X-ray Scattering at Third Generation Synchrotron Sources: Present Activities and Future Plans Invited Speaker: Preview Abstract
Thursday, March 24, 2011 3:06PM - 3:18PM		X21.00002: The new X-ray absorption spectroscopy beamline at Diamond: B18 Silvia Ramos, Giannantonio Cibin, Stephen Parry, Andy J. Dent Preview Abstract
Thursday, March 24, 2011 3:18PM - 3:30PM		X21.00003: The soft x-ray materials research (SXR) instrument at the Linac Coherent Light Source Joshua J. Turner, Oleg Krupin, William Schlotter Preview Abstract
Thursday, March 24, 2011 3:30PM - 3:42PM		X21.00004: Polarization Depend Soft X-ray Scattering of Anisotropic Organic Thin Films H. Ade, E. Gann, B. Collins, H. Yan, J. Cochran, M. Chabinyc Preview Abstract
Thursday, March 24, 2011 3:42PM - 3:54PM		X21.00005: Probing buried interfaces by Index-Matched Soft X-ray Scattering E. Gann, J. Seok, J. Cochran, M. Chabinyc, B. Collins, H. Ade Preview Abstract
Thursday, March 24, 2011 3:54PM - 4:06PM		X21.00006: Lensless x-ray imaging in reflection geometry Daniel Parks, Sujoy Roy, Keoki Seu, Run Su, Joshua Turner, Weilun Chao, Erik Anderson, Stefano Cabrini, Stephen Kevan Preview Abstract
Thursday, March 24, 2011 4:06PM - 4:18PM		X21.00007: Determination of Total X-ray Absorption Coefficient using Non-Resonant X-ray Emission Andrew Achkar, Tom Regier, Eric Monkman, Kyle Shen, David Hawthorn Preview Abstract
Thursday, March 24, 2011 4:18PM - 4:54PM		X21.00008: Hard X-ray Microscopy with Multilayer Laue Lenses Invited Speaker: Preview Abstract
Thursday, March 24, 2011 4:54PM - 5:06PM		X21.00009: Dynamical diffraction effects on beam focusing for x-ray back reflection from curved multi-plate x-ray crystal cavity Ying-Yi Chang, Sung-Yu Chen, Mau-Tsu Tang, M. Yabashi, Yi-Wei Tsai, Yu-Hsin Wu, Shih-Chang Weng, Chia-Hung Chu, Po-Yu Liao, Shih-Lin Chang Preview Abstract
Thursday, March 24, 2011 5:06PM - 5:18PM		X21.00010: High-Resolution Thermal Expansion Measurements of Single-Crystal Sapphire for Application as X-Ray Backscattering Monochromator John J. Neumeier, I. Sergeev, D. Bessas, R.P. Hermann Preview Abstract

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Bulletin of the American Physical Society

APS March Meeting 2011

Volume 56, Number 1

Monday–Friday, March 21–25, 2011; Dallas, Texas

Session Index

Session X21: Focus Session: Novel X-Ray Instrumentation and Measurement Techniques

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