APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011;
Dallas, Texas
Session W3: Advances in ZnO Physics and Applications
11:15 AM–2:15 PM,
Thursday, March 24, 2011
Room: Ballroom A3
Sponsoring
Units:
DCMP DMP
Chair: Scott Chambers, Pacific Northwest National Laboratory
Abstract ID: BAPS.2011.MAR.W3.2
Abstract: W3.00002 : Limits of Conductivity in ZnO Thin Films: Experiment and Theory
11:51 AM–12:27 PM
Preview Abstract
Abstract
Author:
David C. Look
(Wright State University)
Transparent conductive oxides (TCOs) have major (multi-{\$}B) roles in
applications such as flat-panel displays, solar cells, and architectural
glass. The present workhorse TCO is indium-tin-oxide (ITO), but the recent
huge demand for ITO has made In very expensive; moreover, it is toxic. The
most commonly suggested replacement for ITO is ZnO, doped with Al, Ga, or
In, and indeed the ISI lists 628 papers on Group-III-doped ZnO in 2009.
However, to our knowledge, none of these papers has included calculations of
donor N$_{D}$ and acceptor N$_{A}$ concentrations, the fundamental
components of conductivity in semiconductors. We have developed a simple
model for the calculation of N$_{D}$ and N$_{A}$ from temperature-dependent
measurements of carrier concentration n, mobility $\mu $, and film thickness
d. With the inclusion of phonon scattering in the model, excellent fits of n
and $\mu $ are obtained from 15 -- 300 K. Experimentally, we have shown that
highly conductive ZnO films can be grown by pulsed laser deposition in a
pure Ar ambient, rather than the usual O$_{2}$. In a 278-$\mu $m-thick film,
we have achieved a room-temperature resistivity $\rho $ = 1.96 x 10$^{-4}$
$\Omega $-cm, carrier concentration n = 1.14 x 10$^{21}$ cm$^{-3}$, and
mobility $\mu $ = 28.0 cm$^{2}$/V-s. From our model, we calculate N$_{D}$ =
1.60 x 10$^{21}$ and N$_{A}$ = 4.95 x 10$^{20}$ cm$^{-3}$; however, the
model also predicts that a significant reduction of N$_{A}$ would give $\mu
$ = 42.5 cm$^{2}$/V-s and $\rho $ = 7.01 x 10$^{-5} \quad \Omega $-cm, a world
record. Such a reduction in N$_{A}$ may be possible by in-diffusion of Zn
after growth, since there is evidence that one of the major acceptor species
in these films is the Zn-vacancy/Ga$_{Zn}$ complex. We can also decrease the
resistivity by annealing in forming gas, and have recently attained $\rho $
= 1.46 x 10$^{-4} \quad \Omega $-cm, n = 1.01 x 10$^{21}$ cm$^{-3}$, and $\mu $
= 42.2 cm$^{2}$/V-s, giving N$_{D}$ = 1.13 x 10$^{21}$ and N$_{A}$ = 1.09 x
10$^{20}$ cm$^{-3}$. In very thin films, quantum effects must be considered.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.W3.2