APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011;
Session L32: Focus Session: Nano-Optics, Semiconductor and Metal Nanostructures
2:30 PM–5:30 PM,
Tuesday, March 22, 2011
Chair: Henry O. Everitt, Department of the Army, Redstone Arsenal
Abstract ID: BAPS.2011.MAR.L32.7
Abstract: L32.00007 : Infrared and Terahertz Nanoscopy
3:42 PM–4:18 PM
(CIC nanoGUNE Consolider)
During the last years, near-field microscopy based on elastic light
scattering from atomic force microscope tips (scattering-type
near-field optical microscopy, s-SNOM ) has become a powerful
nanoimaging of local dielectric material properties [2-5] and
fields of photonic nanostructures [6-8]. After an introduction of
will discuss recently developed applications in materials
nanophotonics. I will focus particularly on IR and THz imaging at
wavelengths $\lambda $ around 10 and 118 $\mu $m, where we
a wavelength-independent resolution better than 40 nm,
$\lambda $/250 and $\lambda $/3000, respectively . Using
tips, the strong field enhancement at the tip apex probes the local
dielectric properties of a sample, allowing for the simultaneous
of materials and free-carrier concentration in semiconductor
and nanowires . Quantitative free-carrier mapping is enabled by
near-field plasmon-polariton spectroscopy, which can be also
study strain-induced changes of carrier concentration and
Nanoscale imaging of strain and nanocracks in ceramics can be
near-field infrared phonon-polariton spectroscopy . I will
the capability of s-SNOM to image the vectorial near-field
photonic nanostructures. In this application, a dielectric tip
near fields at the sample surface. I will discuss how the
phase-resolved measurement of different near-field components
mapping of the polarization state in nanoscale antenna gaps , of
near-field modes in loaded infrared gap antennas  and of
energy transport in nanoscale transmission lines.
 F. Keilmann, R. Hillenbrand, Phil. Trans. R. Soc. Lond. A
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 R. Hillenbrand et al., Nature 418, 159 (2002).
 A. Huber et al., Nano Lett. 8, 3766 (2008).
 A. Huber et al., Nature Nanotech. 4, 153 (2009).
 J.M. Stiegler et al., Nano Lett. 10, 1387 (2010).
 T. Taubner et al. Science 313, 1595 (2006).
 M. Schnell et al., Nature Photon., 3, 287 (2009).
 M. Schnell et al., Nano Lett., 10, 3524 (2010).
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.L32.7