Bulletin of the American Physical Society
APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011; Dallas, Texas
Session H21: Focus Session: Advances in Scanned Probe Microscopy II -- High Frequencies and Optical Techniques
8:00 AM–11:00 AM,
Tuesday, March 22, 2011
Room: D161
Sponsoring
Unit:
GIMS
Chair: Sebastian Loth, IBM Research
Abstract ID: BAPS.2011.MAR.H21.12
Abstract: H21.00012 : Toward Atomic-Scale Optical Probes with UHV STM*
10:36 AM–10:48 AM
Preview Abstract Abstract
Authors:
\"Ozg\"un S\"uzer
(Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA)
Li Gao
(Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA)
Joseph A. Smerdon
(Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA)
Jongweon Cho
(Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA)
Nathan P. Guisinger
(Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA)
Jeffrey R. Guest
(Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA)
*This work was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Contract No. DE-AC02-06CH11357 and ``SISGR'' Contract No. DE-FG02-09ER16109.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.H21.12
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