Bulletin of the American Physical Society
APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011; Dallas, Texas
Session H12: Focus Session: Dopants and Defects in Semiconductors: Silicon
8:00 AM–11:00 AM,
Tuesday, March 22, 2011
Room: D223/224
Sponsoring
Unit:
DMP
Chair: Bonna Newman, Massachusetts Intitute of Technology
Abstract ID: BAPS.2011.MAR.H12.11
Abstract: H12.00011 : Charged Defects in the Si(001) Surface
10:24 AM–10:36 AM
Preview Abstract
Abstract
Authors:
Steven Schofield
(London Ctr. Nanotech. and Dept. Phys. \& Astron., UCL, London, UK)
Philipp Studer
(London Ctr. Nanotech. and Dept. Electron. \& Elec., UCL, London, UK)
Cyrus Hirjibehedin
(London Ctr. Nanotech., Dept. Phys. \& Astron. and Dept. Chem., UCL, London, UK)
Neil Curson
(London Ctr. Nanotech. and Dept. Electron. \& Elec., UCL, London, UK)
Gabriel Aeppli
(London Ctr. Nanotech. and Dept. Phys. \& Astron., UCL, London, UK)
David Bowler
(London Ctr. Nanotech. and Dept. Phys. \& Astron., UCL, London, UK)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.H12.11
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