Bulletin of the American Physical Society
APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011; Dallas, Texas
Session C1: Poster Session I (2:00pm - 5:00pm)
2:00 PM,
Monday, March 21, 2011
Room: Hall D
Sponsoring
Unit:
APS
Abstract ID: BAPS.2011.MAR.C1.136
Abstract: C1.00136 : Observation of defects in CuInSe$_{2}$ by 300kV aberration corrected scanning transmission electron microscope
Preview Abstract
Abstract
Authors:
Akane Takeshita
(Tokyo Institute of Technology)
Takayuki Tanaka
(Tokyo Institute of Technology)
Tadahiro Kubota
(Honda R\&D Co., Ltd.)
Hideto Miyake
(Mie University)
Hidetaka Sawada
(Japan Electron Optics Laboratory)
Yukihito Kondo
(Japan Electron Optics Laboratory)
Yoshifumi Oshima
(Osaka University)
Yasumasa Tanishiro
(Tokyo Institute of Technology)
Kunio Takayanagi
(Tokyo Institute of Technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.C1.136
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