Bulletin of the American Physical Society

2007 APS March Meeting

Volume 52, Number 1

Monday–Friday, March 5–9, 2007; Denver, Colorado

Session Index

Session N38: Focus Session: Advances in Scanned Probe Microscopy II: Force Methods	Show Abstracts
Sponsoring Units: GIMS Chair: Andreas Heinrich, IBM-Almaden Room: Colorado Convention Center 501

Wednesday, March 7, 2007 8:00AM - 8:36AM		N38.00001: AFM/STM with sub-Angstrom modulation. Invited Speaker: Preview Abstract
Wednesday, March 7, 2007 8:36AM - 8:48AM		N38.00002: Atomically-resolved surface imaging by low temperature atomic force microscopy using a quartz resonator Yukio Hasegawa, Toshu An, Takahiro Nishio, Toyoaki Eguchi, M. Ono, Kotone Akiyama Preview Abstract
Wednesday, March 7, 2007 8:48AM - 9:00AM		N38.00003: Imaging of electronic defect states in SiO2 and HfSiOx films with sub-nanometer spatial resolution by two-way Single Electron Tunneling Force Mircroscopy J.P. Johnson, N. Zheng, C.C. Williams Preview Abstract
Wednesday, March 7, 2007 9:00AM - 9:12AM		N38.00004: Detection of Embedded nanostructures by Electrostatic Force Microscopy Zonghai Hu, Yuanzhen Chen, Michael Fischbein, Robin Havener, Marija Drndic Preview Abstract
Wednesday, March 7, 2007 9:12AM - 9:24AM		N38.00005: Sinc or Sine? The Band Excitation Method and Energy Dissipation Measurements by SPM Stephen Jesse, Sergei Kalinin Preview Abstract
Wednesday, March 7, 2007 9:24AM - 9:36AM		N38.00006: Spring constant calibration of AFM cantilevers with a piezolever transfer standard D. Hurley, E. Langlois, G. Shaw, J. Kramar, J. Pratt Preview Abstract
Wednesday, March 7, 2007 9:36AM - 9:48AM		N38.00007: High Speed Scanning Property Measurements David Shuman, Ramesh Nath, Ramamoorthy Ramesh, Bryan Huey Preview Abstract
Wednesday, March 7, 2007 9:48AM - 10:00AM		N38.00008: Atomic Force Microscope Tip for Dielectrophoresis J.A. Aguilar, T.P. Hunt, A.C. Bleszynski, R.M. Westervelt Preview Abstract
Wednesday, March 7, 2007 10:00AM - 10:12AM		N38.00009: Cantilever mean deflection: average tip-sample force in tapping mode spectroscopy F. Michael Serry Preview Abstract
Wednesday, March 7, 2007 10:12AM - 10:24AM		N38.00010: ABSTRACT WITHDRAWN Preview Abstract
Wednesday, March 7, 2007 10:24AM - 10:36AM		N38.00011: Monotonic and fatigue tests of amorphous silicon nanostructures using atomic force microscope Churamani Gaire, D.-X. Ye, T.-M. Lu, G.-C. Wang, C. R. Picu Preview Abstract
Wednesday, March 7, 2007 10:36AM - 10:48AM		N38.00012: Enhanced compositional sensitivity in atomic force microscopy by the excitation of the first two flexural modes Ricardo Garcia, Nicolas F. Martinez, Shivprasad Patil, Jose R. Lozano Preview Abstract
Wednesday, March 7, 2007 10:48AM - 11:00AM		N38.00013: Systematic Variations in Apparent Topographic Height as Measured by Non-contact Atomic Force Microscopy Deng-Sung Lin, T.-C. Chiang, K.M. Yang, J.Y. Chung, M.F. Hsieh, S.S. Ferng Preview Abstract

About APS

The American Physical Society (APS) is a non-profit membership organization working to advance the knowledge of physics.

Headquarters 1 Physics Ellipse, College Park, MD 20740-3844 (301) 209-3200
Editorial Office 100 Motor Pkwy, Suite 110, Hauppauge, NY 11788 (631) 591-4000
Office of Public Affairs 529 14th St NW, Suite 1050, Washington, D.C. 20045-2001 (202) 662-8700

Bulletin of the American Physical Society

2007 APS March Meeting

Volume 52, Number 1

Monday–Friday, March 5–9, 2007; Denver, Colorado

Session Index

Session N38: Focus Session: Advances in Scanned Probe Microscopy II: Force Methods

Follow Us

Engage

My APS

Information for

About APS