Tuesday, March 6, 2007 
2:30PM - 2:42PM 
 
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L41.00001: Gas cluster ion irradiation in formation of nano-ripple structures on silicon surfaces and its applications to producing III-nitride nanorods 
O. Lozano, X.M. Wang, Q.Y. Chen, J.R. Liu, P.V. Chinta, P.V. Wadekar, Wei-Kan Chu, H.W. Seo, L.W. Tu, Y.T. Lin, Y.L. Cheng
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Tuesday, March 6, 2007 
2:42PM - 2:54PM 
 
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L41.00002: Studies of Ripple Formation on Si Surfaces During Ar$^{+}$ Ion Bombardment 
Gozde Ozaydin, Karl F. Ludwig, Hua Zhou, Randall L. Headrick
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Tuesday, March 6, 2007 
2:54PM - 3:06PM 
 
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L41.00003: Vertical Asymmetry and the Ripple Rotation Transition in the Epitaxial Growth and Erosion on (110) Crystal Surfaces 
Leonardo Golubovic, Artem Levandovsky
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Tuesday, March 6, 2007 
3:06PM - 3:18PM 
 
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L41.00004: Light scattering as a technique to probe grain boundary melting 
Erik Thomson, John Wettlaufer, Larry Wilen
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Tuesday, March 6, 2007 
3:18PM - 3:30PM 
 
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L41.00005: Adatoms, Grain Boundaries, and Thin Film Growth Stress 
Edmund Webb III, Stephen Foiles, Chun-Wei Pao, David Srolovitz, Jerrold Floro
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Tuesday, March 6, 2007 
3:30PM - 3:42PM 
 
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L41.00006: Grain-boundary grooving and agglomeration of alloy thin films: phase-field simulations 
Mathieu Bouville, Dongzhi Chi, David J. Srolovitz
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Tuesday, March 6, 2007 
3:42PM - 3:54PM 
 
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L41.00007: Enhanced growth instability of strained film on curved substrate 
Yu Zhang, Hangyao Wang, Feng Liu
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Tuesday, March 6, 2007 
3:54PM - 4:06PM 
 
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L41.00008: Si-Ge Intermixing and the 5x5-(111) Surface Reconstruction 
Demetra Psiachos, M. J. Stott
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Tuesday, March 6, 2007 
4:06PM - 4:18PM 
 
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L41.00009: Ti as an Interface Stabilizer for Fe/Al and Al/Fe Interfaces 
W. Priyantha, A. Comouth, A. Kayani, H. Chen, M. Kopczyk, R.J. Smith, D. McCready
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Tuesday, March 6, 2007 
4:18PM - 4:30PM 
 
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L41.00010: Impurity Segregation at the Si/SiO$_{2}$ Interface 
A. G. Marinopoulos, K. van Benthem, S. Rashkeev, S. J. Pennycook, S. T. Pantelides
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Tuesday, March 6, 2007 
4:30PM - 4:42PM 
 
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L41.00011: Temperature Induced Modifications of SiC Interfaces studied by High Resolution Electron Energy Loss Spectroscopy 
J.A. Schaefer, M. Eremtchenko, J. Uhlig, A. Neumann, R. Oettking, S.I.-U. Ahmed
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Tuesday, March 6, 2007 
4:42PM - 4:54PM 
 
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L41.00012: ABSTRACT HAS BEEN MOVED TO X19.00015 
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Tuesday, March 6, 2007 
4:54PM - 5:06PM 
 
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L41.00013: Measurement of Young's modulus of thin films using modal characterization. 
Dragoslav Grbovic, Nickolay Lavrik, Panos Datskos
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