Bulletin of the American Physical Society

2007 APS March Meeting

Volume 52, Number 1

Monday–Friday, March 5–9, 2007; Denver, Colorado

Session Index

Session L38: Focus Session: Advances in Scanned Probe Microscopy I: Low Temperatures, Manipulation,and Optical Methods I	Show Abstracts
Sponsoring Units: GIMS Chair: Joseph Stroscio, National Institute of Standards and Technology Room: Colorado Convention Center 501

Tuesday, March 6, 2007 2:30PM - 2:42PM		L38.00001: An ultrahigh vacuum, variable temperature scanning tunneling microscope E.W. Hudson, W.D. Wise, Kamalesh Chatterjee, M.C. Boyer Preview Abstract
Tuesday, March 6, 2007 2:42PM - 2:54PM		L38.00002: Scanning tunneling microscopy in high magnetic fields below 1 Kelvin Andreas Heinrich, Donald Eigler, Cyrus Hirjibehedin, Markus Ternes, Christopher Lutz Preview Abstract
Tuesday, March 6, 2007 2:54PM - 3:06PM		L38.00003: Construction of a sub-Kelvin ultra-high vacuum scanning tunneling microscope in high magnetic field Ungdon Ham, Xi Chen, Chi Chen, Freddy Toledo, Wilson Ho Preview Abstract
Tuesday, March 6, 2007 3:06PM - 3:18PM		L38.00004: Design of a 20 mK/15 T STM system Young Jae Song, Steve Blankenship, Jason Crain, Joseph Stroscio Preview Abstract
Tuesday, March 6, 2007 3:18PM - 3:30PM		L38.00005: Atomistic constructions using a scanning tunneling microscope. Aparna Deshpande, Joel Vaughn, Saw-Wai Hla Preview Abstract
Tuesday, March 6, 2007 3:30PM - 3:42PM		L38.00006: Scanning Tunneling Microscope Manipulation of $\beta$-Carotene on Au(111) at 4.6 K Timur Skeini, Violeta Iancu, Saw-Wai Hla Preview Abstract
Tuesday, March 6, 2007 3:42PM - 3:54PM		L38.00007: Vertical Atom Manipulation on GaN(000$\overline 1 $) Surface at Low Temperature Danda P. Acharya, Kendal Clark, Saw W. Hla Preview Abstract
Tuesday, March 6, 2007 3:54PM - 4:06PM		L38.00008: Design and Construction of a UHV-LT-STM for Tip-Enhanced Optics. D.R. Daughton, D. Lee, N. Ezeh, J.A. Gupta Preview Abstract
Tuesday, March 6, 2007 4:06PM - 4:18PM		L38.00009: Stress Imaging in Indented Si Wafers by Confocal Raman Microscopy Jeroen Schoenmaker, Robert F. Cook, Lukas Novotny, Stephan J. Stranick Preview Abstract
Tuesday, March 6, 2007 4:18PM - 4:30PM		L38.00010: Tip Enhanced Raman Scattering of Strained Silicon with Single and Multiple Probe Scanned Probe Microscopes. Aaron Lewis Preview Abstract
Tuesday, March 6, 2007 4:30PM - 4:42PM		L38.00011: High Efficiency Surface Plasmon Enhanced Near-field Scanning Optical Microscope Probe Development. R.E. Hollingsworth, G.J. Nuebel, I.C. Schick, P.D. Flammer, J.T. Martineau, M.A. Hurowitz, R.T. Collins Preview Abstract
Tuesday, March 6, 2007 4:42PM - 4:54PM		L38.00012: A Silicon MEMS Probe Integrated with Light Emitting Nanoparticles on Tip for Near-field Scanning Optical Microscopy X. Zhang, K. Hoshino, L. Rozanski, D. Vanden Bout Preview Abstract
Tuesday, March 6, 2007 4:54PM - 5:06PM		L38.00013: Spectroscopic near-field microscopy using frequency combs in the mid-infrared Markus Brehm, Albert Schliesser, Fritz Keilmann Preview Abstract
Tuesday, March 6, 2007 5:06PM - 5:18PM		L38.00014: Element specific imaging by STM combined with synchrotron radiation light Toyoaki Eguchi, Taichi Okuda, Takeshi Matsushima, Akira Kataoka, Ayumi Harasawa, Kotone Akiyama, Toyohiko Kinoshita, Yukio Hasegawa Preview Abstract
Tuesday, March 6, 2007 5:18PM - 5:30PM		L38.00015: Waveguide Characterization Using Shear Force Scanning Optical Microscopy. Rongjin Yan, G. Yuan, R. Pownall, K. Lear Preview Abstract

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Bulletin of the American Physical Society

2007 APS March Meeting

Volume 52, Number 1

Monday–Friday, March 5–9, 2007; Denver, Colorado

Session Index

Session L38: Focus Session: Advances in Scanned Probe Microscopy I: Low Temperatures, Manipulation,and Optical Methods I

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