2007 APS March Meeting
Volume 52, Number 1
Monday–Friday, March 5–9, 2007;
Denver, Colorado
Session A6: Frontier in Computational Materials
8:00 AM–11:00 AM,
Monday, March 5, 2007
Colorado Convention Center
Room: 207
Sponsoring
Unit:
DCOMP
Chair: Giulia Galli, University of California, Davis
Abstract ID: BAPS.2007.MAR.A6.1
Abstract: A6.00001 : Quantum Design of Complex Nanostructured Electronic Materials
8:00 AM–8:36 AM
Preview Abstract
Abstract
Author:
Andrew Williamson
(Lawrence Livermore National Laboratory)
Over the last decade, our ability to predict the fundamental
properties of
nanoscale building blocks such as quantum dots, wires, and slabs has
improved dramatically. In particular, first principles modeling
techniques
can now routinely predict how the structural, electronic,
optical, and
transport properties of these building blocks depends on their
size, shape,
composition, and surface structure.
In this talk we present the results of three projects designed to
build upon
these fundamental studies to engineer novel, nanostructured
materials with
tailored electronic properties. These complex, nanoscale
heterostructure
materials utilize both the unique properties of their nanoscale
building
blocks and the interactions between the constituent building
blocks to
engineer the ideal material properties.
(i) We will describe the design of a silicon/germanium nanowire
based
thermoelectric material whose performance is enhanced by
suppressing thermal
transport and enhancing electronic transport. This is achieved by
engineering the nanoscale confinement and scattering of phonons and
electrons.
(ii) We will describe the design of a silicon based laser,
constructed from
silicon nanocrystals embedded in an amorphous silicon nitride
matrix. Models
of the electronic states in the nanocrystal, the surrounding
matrix, and the
interface between the two, enable us to optimize the optical
efficiency of
the emission and electrically pump the laser.
(iii) We will describe the use of first principles models to
predict the
optical response of silicon nanowires. These predictions are used to
interpret the results of optical scatterometry metrology which
can measure
the size and surface roughness of nanoscale electronic devices
produced by a
combination of lithography and etching.
This work was performed under the auspices of the U.S. Dept. of
Energy at
the University of California/Lawrence Livermore National
Laboratory under
contract no. W-7405-Eng-48.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2007.MAR.A6.1