2007 APS March Meeting
Volume 52, Number 1
Monday–Friday, March 5–9, 2007;
Denver, Colorado
Session N44: Focus Session: Optical Properties of Nanowires and Nanocrystals
8:00 AM–10:36 AM,
Wednesday, March 7, 2007
Colorado Convention Center
Room: 507
Sponsoring
Unit:
DMP
Chair: Greg Salamo, University of Arkansas
Abstract ID: BAPS.2007.MAR.N44.10
Abstract: N44.00010 : Short-wavelength visible light emission from silicon nanocrystals*
9:48 AM–10:00 AM
Preview Abstract
Abstract
Authors:
Xiaodong Pi
(Department of Mechanical Engineering, University of Minnesota, Minneapolis 55455)
Rick Liptak
(Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis 55455)
Stephen Campbell
(Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis 55455)
Uwe Kortshagen
(Department of Mechanical Engineering, University of Minnesota, Minneapolis 55455)
Si is the material of choice for modern microelectronics but, as an
indirect-bandgap semiconductor, it is not an efficient light emitter. An
electrically pumped Si laser would present a breakthrough for optoelectronic
integration that may enable optical interconnect to make computers faster.
Si light emitting diodes may revolutionize solid-state lighting and displays
because of the low cost and environmental friendliness of Si. One of the
most challenging problems of Si-based lighting and displays is the lack of a
reliable and efficient full visible spectrum emission. Si nanocrystals
(Si-NCs) have so far been the most promising form of Si to emit light. Most
of the synthesis approaches of Si-NCs, however, only lead to red light
emission. Our recent work on Si-NCs synthesized by non-thermal plasmas has
focused on extending their light emission into the short-wavelength range.
Firstly, the process of oxidation-etching-oxidation of Si-NCs is
investigated. This process causes the size of Si-NCs to decrease, leading to
shorter wavelength light emission from Si-NCs. Yellow or green
photoluminescence (PL) has been observed from initially oxidized red light
emitting Si-NCs after HF vapour etching and atmospheric oxidation. The
intensity of PL from Si-NCs, however, decreases by a factor up to 100. It is
found that HF etching restructures the surface of Si-NCs. This leads to a
decrease in the incorporation of O during subsequent oxidation, which
finally results in silicon suboxide SiO$_{1.9}$. Such an understoichiometry
indicates a high density of defects such as Si dangling bonds at the
Si-NC/oxide interface. Therefore, the PL efficiency is extremely low for
short-wavelength light emitting Si-NCs obtained by the process of
oxidation-etching-oxidation.
Secondly, an integrated two-stage plasma system is employed to achieve the
light emission from Si-NCs in the full visible spectrum range.
Red-light-emitting Si-NCs are produced in the first stage by the plasma
decomposition of SiH$_{4}$. In the second stage a tetrafluoromethane
(CF$_{4})$-based plasma etches Si-NCs and at the same time passivates them
with carbon and fluorine. After the two-stage process Si-NCs emit light in
the short-wavelength region from yellow to blue. We find that a self-limited
oxidation process blueshifts the light emission until saturation is reached.
Significantly, relatively high quantum yields of short-wavelength light
emission from Si-NCs are obtained in spite of oxidation. It is interesting
to note that Si-NCs treated by CF$_{4}$-based plasma are hydrophilic while
those without CF$_{4}$-based plasma treatment are hydrophobic.
*This work was supported in part by the MRSEC Program of the National Science Foundation under Award Number DMR-0212302.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2007.MAR.N44.10