Bulletin of the American Physical Society

2005 APS March Meeting

Monday–Friday, March 21–25, 2005; Los Angeles, CA

Session Index

Session U20: High-K Dielectrics	Show Abstracts
Sponsoring Units: DMP Chair: Rodney McKee, ORNL Room: LACC 407

Thursday, March 24, 2005 8:00AM - 8:12AM		U20.00001: Theory of structural and dielectric properties of amorphous high-K dielectrics David Vanderbilt, Davide Ceresoli Preview Abstract
Thursday, March 24, 2005 8:12AM - 8:24AM		U20.00002: Dielectric properties of high-k oxides: Theory and experiment for Lu2O3 Emiliano Bonera, Giovanna Scarel, Marco Fanciulli, Pietro Delugas, Vincenzo Fiorentini Preview Abstract
Thursday, March 24, 2005 8:24AM - 8:36AM		U20.00003: Novel Chalcogenide Buffer Layer for Oxide Heteroepitaxy on Si(001) D. Schmidt, T. Ohta, Q. Yu, F. S. Ohuchi, M. A. Olmstead Preview Abstract
Thursday, March 24, 2005 8:36AM - 8:48AM		U20.00004: THz Optical Response from Coupled Ferroelectric/LO Phonon Mode in BaTiO3/Si(100) Muneaki Hase, Masahiro Kitajima, Venu Vaithyanathan, Darrell G. Schlom, Jeremy Levy, Hrvoje Petek Preview Abstract
Thursday, March 24, 2005 8:48AM - 9:00AM		U20.00005: Valence band offsets and interface structure of HfxSi1-xO2 films on Si(111) from photoemission spectroscopy John Rowe, Les Fleming, Gerry Lucovsky, Marc Ulrich Preview Abstract
Thursday, March 24, 2005 9:00AM - 9:12AM		U20.00006: Infrared absorption spectra at interfaces from first principles: Origin of LO and TO red shifts in ultrathin oxide films on silicon Feliciano Giustino, Alfredo Pasquarello Preview Abstract
Thursday, March 24, 2005 9:12AM - 9:24AM		U20.00007: Thickness measurement of interfacial layer between HfO$_2$ film and Si substrate by Fourier analysis of x-ray reflectivity Y. J. Park, J.-S. Lee, B. H. Seung, S. Ji, K.-B. Lee, H. S. Hwang Preview Abstract
Thursday, March 24, 2005 9:24AM - 9:36AM		U20.00008: Thin single crystal Sc2O3 Films on Si (111) with very sharp interface M. Hong, H. Y. Lee, A. R. Kortan, J. Kwo, P. Chang, Y. L. Huang, C. P. Chen Preview Abstract
Thursday, March 24, 2005 9:36AM - 9:48AM		U20.00009: Electronic properties and band alignments of Hf-based gate dielectrics on silicon R. Puthenkovilakam, J. Choi, J.P. Chang Preview Abstract
Thursday, March 24, 2005 9:48AM - 10:00AM		U20.00010: High-K MISFET channel mobility from magnetoresistance R.T. Bate, W.W. Chance, P. Kumar, W.P. Kirk Preview Abstract
Thursday, March 24, 2005 10:00AM - 10:12AM		U20.00011: First-principles investigation of oxygen diffusion in compressively strained high-density silicon oxide T. Akiyama, H. Kageshima, M. Uematsu, T. Ito Preview Abstract
		U20.00012: Size effect in self-trapped exciton photoluminescence from SiO2-based nanoscale materials Yuri Glinka Preview Abstract
		U20.00013: Dielectric function of annealed sub-stoichiometric silicon oxide layers Emanuele Rimini, Corrado Spinella, Corrado Bongiorno, Giuseppe Nicotra Preview Abstract

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Bulletin of the American Physical Society

2005 APS March Meeting

Monday–Friday, March 21–25, 2005; Los Angeles, CA

Session Index

Session U20: High-K Dielectrics

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