Wednesday, March 23, 2005
2:30PM - 2:42PM
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S44.00001: Detection and Manipulation of the Statistical Fluctuations in Nuclear Spin Ensembles Using Magnetic Resonance Force Microscopy
H.J. Mamin, R. Budakian, B.W. Chui, D. Rugar
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Wednesday, March 23, 2005
2:42PM - 2:54PM
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S44.00002: Force-detected ESR from E$^\prime$ centers
Palash Banerjee, Yulu Che, K.C. Fong, Tim Mewes, Vidya Bhallamudi, Denis V. Pelekhov, P. Chris Hammel
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Wednesday, March 23, 2005
2:54PM - 3:06PM
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S44.00003: MRFM and non-contact friction experiments under UHV conditons
S. Rast, U. Gysin, P. Ruff, C. Wehrle, H.-R. Hidber, E. Meyer, P. Vettiger, M. Despont, C. Gerber, D.W. Lee
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Wednesday, March 23, 2005
3:06PM - 3:18PM
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S44.00004: Tip design and tip-sample interaction in magnetic resonance force microscopy
Sean Garner, Seppe Kuehn, John Marohn
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Wednesday, March 23, 2005
3:18PM - 3:30PM
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S44.00005: NMR Force Microscopy on an hcp Co single crystal
Yuri Obukhov, Denis Pelekhov, P. Chris Hammel
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Wednesday, March 23, 2005
3:30PM - 3:42PM
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S44.00006: Magnetic Resonance Force Microscopy and Force-Detected NMR of Microcrystals
J. T. Markert, A. D. Cambou, J.-H. Choi, S. Guchhait, Y. J. Lee, W. Lu, U. M. Mirsaidov
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Wednesday, March 23, 2005
3:42PM - 3:54PM
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S44.00007: Development of a New Generation of Piezoresistive Cantilevers Designed for Torque Magnetometry
Stefan Kohout
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Wednesday, March 23, 2005
3:54PM - 4:06PM
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S44.00008: Ultra-Sensitive Micromechanical Cantilevers with Integrated Magnetic Structures
Michelle D. Chabot, John M. Moreland, Lan Gao, Sy-Hwang Liou, Casey W. Miller
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Wednesday, March 23, 2005
4:06PM - 4:18PM
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S44.00009: Zeptogram Scale Nanomechanical Mass Sensing
Y.T. Yang, Carlo Callegari, X.L. Feng, K.L. Ekinci, M.L. Roukes
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Wednesday, March 23, 2005
4:18PM - 4:30PM
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S44.00010: Toward single-molecule nanomechanical mass spectrometry
W.K. Hiebert, X.L. Feng, M.L. Roukes
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Wednesday, March 23, 2005
4:30PM - 4:42PM
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S44.00011: On recent developments for high-speed AFM imaging
Georg Schitter, Georg E. Fantner, Johannes H. Kindt, Paul K. Hansma
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Wednesday, March 23, 2005
4:42PM - 4:54PM
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S44.00012: Measuring AFM Cantilever Spring Constants
Katie Chynoweth, Mahlon Wigton, Kristine Lang
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Wednesday, March 23, 2005
4:54PM - 5:06PM
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S44.00013: Force Microscopy with Light Atom Probes
Franz Giessibl, Stefan Hembacher, Jochen Mannhart
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Wednesday, March 23, 2005
5:06PM - 5:18PM
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S44.00014: Coupled ion - nanomechanical systems
Lin Tian, Peter Zoller
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S44.00015: Nanomagnetic Planar Magnetic Resonance Microscopy ``Lens''
Mladen Barbic, Axel Scherer
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