Bulletin of the American Physical Society

2005 APS March Meeting

Monday–Friday, March 21–25, 2005; Los Angeles, CA

Session Index

Session A18: Focus Session: Semiconductor Characterization	Show Abstracts
Sponsoring Units: FIAP GIMS Chair: David Seiler, NIST Room: LACC 406A

Monday, March 21, 2005 8:00AM - 8:36AM		A18.00001: Interface Sensitive Measurement of High k - silicon dioxide – silicon system using Optical Second Harmonic Generation Invited Speaker: Preview Abstract
Monday, March 21, 2005 8:36AM - 8:48AM		A18.00002: Measurement of the Full State of Stress of Silicon with Micro-Raman Spectroscopy Stephen Harris, Ann O'Neill, Wen Yang, Peter Gustafson, James Boileau, W.H. Weber, Bhaskar Majumdar, Somnath Ghosh Preview Abstract
Monday, March 21, 2005 8:48AM - 9:00AM		A18.00003: UV-Raman deformation coefficients in Si and SiGe alloys Michael Canonico, Ran Liu Preview Abstract
Monday, March 21, 2005 9:00AM - 9:12AM		A18.00004: In-situ photovoltage shift measurements of hafnium oxides and silicates grown on Si(100) using femtosecond photoelectron spectroscopy Daeyoung Lim, Richard Haight Preview Abstract
Monday, March 21, 2005 9:12AM - 9:24AM		A18.00005: An infrared probe of tunable dielectrics in metal-oxide-semiconductor structures Kevin Mikolaitis, Zhiqiang Li, Guangming Wang, Alan Heeger, Dimitri Basov Preview Abstract
Monday, March 21, 2005 9:24AM - 9:36AM		A18.00006: High Resolution 2D Dopant Profiling of FinFET Structures using Scanning Probe Microscopy Alexander Khajetoorians, Jianlong Li, Li Shi, Xiang-Dong Wang, Chih-Kang Shih Preview Abstract
Monday, March 21, 2005 9:36AM - 9:48AM		A18.00007: High-Resolution Microcalorimeters for X-ray Microanalysis B.L. Zink, G.C. Hilton, J.N. Ullom, K.D. Irwin Preview Abstract
Monday, March 21, 2005 9:48AM - 10:00AM		A18.00008: High-resolution characterization of advanced interconnect and packaging architectures Shriram Ramanathan, Evan Pickett, Patrick Morrow, Yongmei Liu, Rajen Dias Preview Abstract
Monday, March 21, 2005 10:00AM - 10:12AM		A18.00009: Direct Imaging of Minority Carrier Drift in Luminescent Materials David Luber, Nancy Haegel Preview Abstract
Monday, March 21, 2005 10:12AM - 10:24AM		A18.00010: Contact-free approach for the determination of minority carrier diffusion length F.M. Bradley, Will Freeman, Nancy M. Haegel Preview Abstract
Monday, March 21, 2005 10:24AM - 10:36AM		A18.00011: Structural and morphological characterization of GaN(0001) layers grown on SiC by maskless pendeo-epitaxy via X-ray Microdiffraction R.I. Barabash, G.E. Ice, S. Einfeldt, D. Hommel, A.M. Roskovski, R.F. Davis Preview Abstract
Monday, March 21, 2005 10:36AM - 10:48AM		A18.00012: UHV Nanoworkbench and the `Roaming' Field Effect Transistor Olivier Guise, John T. Yates, Jr., Joachim Ahner, Jeremy Levy Preview Abstract
Monday, March 21, 2005 10:48AM - 11:00AM		A18.00013: An investigation of dopping profile for a one dimensional heterostructure ZhaoHui Huang, Dragan Stojkovic, Paul Lammert, Vincent Crespi Preview Abstract

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Bulletin of the American Physical Society

2005 APS March Meeting

Monday–Friday, March 21–25, 2005; Los Angeles, CA

Session Index

Session A18: Focus Session: Semiconductor Characterization

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