Bulletin of the American Physical Society
73rd Annual Gaseous Electronics Virtual Conference
Volume 65, Number 10
Monday–Friday, October 5–9, 2020; Time Zone: Central Daylight Time, USA.
Session XF2: Diagnostics III: Optical Diagnostics
9:45 AM–12:00 PM,
Friday, October 9, 2020
Chair: Matthew Goeckner, University of Texas, Dallas
Abstract: XF2.00002 : In -situ Raman thermometry as a tool to study Low temperature plasma -- material surface interactions*
10:00 AM–10:15 AM
Live
Preview Abstract Abstract
Authors:
Carla Berrospe Rodriguez
(University of California, Riverside)
Joseph Schwan
(University of California, Riverside)
Lorenzo Mangolini
(University of California, Riverside)
*In -situ Raman thermometry as a tool to study Low temperature plasma – material surface interactions
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