Bulletin of the American Physical Society
71st Annual Gaseous Electronics Conference
Volume 63, Number 10
Monday–Friday, November 5–9, 2018; Portland, Oregon
Session TF3: Diagnostics II (Electrical)
9:30 AM–12:00 PM,
Friday, November 9, 2018
Oregon Convention Center
Room: A106
Chair: Tom Huiskamp, Tech. Universiteit, Eindhoven, & Guus Pemen, Tech. Universiteit, Eindhoven
Abstract ID: BAPS.2018.GEC.TF3.4
Abstract: TF3.00004 : Probe tip length effect of cutoff probe for measurement of high density plasma based on a new circuit cutoff model*
10:30 AM–10:45 AM
Preview Abstract Abstract
Authors:
SiJun Kim
(Applied Physics lab for PLasma Engineering (APPLE), Department of Physics, Chungnam Natl Univ)
JangJae Lee
(Applied Physics lab for PLasma Engineering (APPLE), Department of Physics, Chungnam Natl Univ)
DaeWoong Kim
(Korea Institute of Machinery and Materials (KIMM))
Jung-Hyung Kim
(Korea Research Institute of Standards and Science (KRISS))
ShinJae You
(Applied Physics lab for PLasma Engineering (APPLE), Department of Physics, Chungnam Natl Univ)
*This research was supported by the Ministry of Science, ICT and Future Planning (NRF-2017R1D1A1A02018310, NRF-2017M1A7A1A02016321)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.GEC.TF3.4
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