Thursday, October 3, 2013
10:00AM - 10:15AM
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NR2.00001: Simulating the Spontaneous Formation of Self-Organized Anode Spot Patterns in Arc Discharges
Juan Trelles
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Thursday, October 3, 2013
10:15AM - 10:30AM
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NR2.00002: Effects of Asymmetric Secondary Emission on Plasma Properties of ExB Discharges
Hongyue Wang, Michael Campanell, Igor Kaganovich, Alexander Khrabrov, Yevgeny Raitses, Dmytro Sydorenko, Guobiao Cai
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Thursday, October 3, 2013
10:30AM - 10:45AM
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NR2.00003: Molecular dynamics simulation of plasma-induced Si substrate damage: Latent defect structures and bias-frequency effects
Koji Eriguchi, Asahiko Matsuda, Yoshinori Takao, Kouichi Ono
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Thursday, October 3, 2013
10:45AM - 11:00AM
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NR2.00004: Secondary electron emission yield dependence on the Fermi level in Silicon
David Urrabazo, Matthew Goeckner, Lawrence Overzet
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Thursday, October 3, 2013
11:00AM - 11:15AM
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NR2.00005: Experimental Evidence of Change in Sheath Properties due to Secondary Electron Emission in a Crossed Field Plasma Setup
Kapil Sawlani, John Foster
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Thursday, October 3, 2013
11:15AM - 11:30AM
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NR2.00006: Combined plasma and molecular dynamics simulations for a better prediction of plasma surface interactions: Cryogenic etching of silicon with fluorine-containing gases
Stefan Tinck, Erik Neyts, Annemie Bogaerts
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Thursday, October 3, 2013
11:30AM - 11:45AM
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NR2.00007: Reversible plasma-based functionalization of advanced carbon materials
Eva Kovacevic, Johannes Berndt, Thomas Strunskus, Nicolas Camara, Christophe Cachoncinlle, Mireille Gaillard, Chantal Boulmer-Leborgne
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Thursday, October 3, 2013
11:45AM - 12:00PM
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NR2.00008: Optimization of plasma ionization sources for ambient mass spectrometry surface analysis
Kirsty McKay, Jun-Seok Oh, Andrew Bowfield, Tara Salter, James Walsh, Ian Gilmore, James Bradley
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Thursday, October 3, 2013
12:00PM - 12:15PM
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NR2.00009: Plasma-Surface Interactions and Feature Profile Simulations
Paul Moroz, Daniel Moroz
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