Bulletin of the American Physical Society
62nd Annual Gaseous Electronics Conference
Volume 54, Number 12
Tuesday–Friday, October 20–23, 2009; Saratoga Springs, New York
Session URP: Poster Session II (4:00 - 6:00PM)
4:00 PM,
Thursday, October 22, 2009
Saratoga Springs City Center
Room: Hall D
Abstract ID: BAPS.2009.GEC.URP.56
Abstract: URP.00056 : Sheath Effects on Electron Density Measurements in Frequency Shift Probe and their Application to Electron Temperature Measurements
Preview Abstract Abstract
Authors:
Keiji Nakamura
(Chubu University)
Qi Zhang
(Chubu University)
Hideo Sugai
(Chubu University)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2009.GEC.URP.56
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