Bulletin of the American Physical Society
60th Annual Meeting of the APS Division of Plasma Physics
Volume 63, Number 11
Monday–Friday, November 5–9, 2018; Portland, Oregon
Session JP11: Poster Session IV: Education and Outreach; Undergraduate or High School Research; Plasma technology, Fusion reactor Nuclear and Materials Science; Propulsion; Materials Interfaces (2:00pm-5:00pm)
Tuesday, November 6, 2018
OCC
Room: Exhibit Hall A1&A
Abstract ID: BAPS.2018.DPP.JP11.104
Abstract: JP11.00104 : Reference Standards for Multipactor Validation*
Presenter:
Nicholas Jordan
(Univ of Michigan - Ann Arbor)
Authors:
Nicholas Jordan
(Univ of Michigan - Ann Arbor)
Stephen V Langellotti
(Univ of Michigan - Ann Arbor)
Foivos Antoulinakis
(Univ of Michigan - Ann Arbor)
Ronald Matthew Gilgenbach
(Univ of Michigan - Ann Arbor)
Yue-Ying Lau
(Univ of Michigan - Ann Arbor)
Multipactor events pose a serious risk to high and medium-power microwave electronics, particularly in space-borne applications. While testing standards have been developed by the satellite community, the difficulty of predicting multipactor in the presence of complex geometries, materials, and RF signals has led to the use of large safety margins, greatly increasing the cost of fielded systems.
As part of a broader multipactor-focused Multi-University Research Initiative (MURI), the University of Michigan is developing a test cell reference standard to foster comparisons of multipactor mitigation techniques across multiple research institutions. Similar experimental platform standards have been applied to R&D efforts in other fields, allowing researchers to more easily make direct comparisons between their results. The development of a planar test standard for multipactor should bring similar benefits. We will report on the design of the test standard, as well as additional progress in the analysis of multipactor in coaxial geometries.*Work supported by AFOSR MURI Grant FA9550-18-1-0062 through Michigan State University, by AFOSR Grant FA9550-18-1-0153, and by L3 Technologies Electron Devices Division.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.DPP.JP11.104
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