55th Annual Meeting of the APS Division of Plasma Physics
Volume 58, Number 16
Monday–Friday, November 11–15, 2013;
Denver, Colorado
Session VI3: Technology Applications of Plasmas and Charged Particle Beams
3:00 PM–5:00 PM,
Thursday, November 14, 2013
Room: Plaza F
Chair: J. Gary Eden, University of Illinois
Abstract ID: BAPS.2013.DPP.VI3.3
Abstract: VI3.00003 : Advances in Plasma Process Equipment Development using Plasma and Electromagnetics Modeling
4:00 PM–4:30 PM
Preview Abstract
Abstract
Author:
Ankur Agarwal
(Applied Materials Inc.)
Plasma processing is widely used in the semiconductor industry for thin film
etching and deposition, modification of near-surface material, and cleaning.
In particular, the challenges for plasma etching have increased as the
critical feature dimensions for advanced semiconductor devices have
decreased to 20 nm and below. Critical scaling limitations are increasingly
driving the transition to 3D solutions such as multi-gate MOSFETs and 3D
NAND structures. These structures create significant challenges for
dielectric and conductor etching, especially given the high aspect ratio
(HAR) of the features. Plasma etching equipment must therefore be capable of
exacting profile control across the entire wafer for feature aspect ratios
up to 80:1, high throughput, and exceptionally high selectivity. The
multiple challenges for advanced 3D structures are addressed by Applied
Material's plasma etching chambers by providing highly sophisticated control
of ion energy, wafer temperature and plasma chemistry.
Given the costs associated with such complex designs and reduced development
time-scales, much of these design innovations have been enabled by utilizing
advanced computational plasma modeling tools. We have expended considerable
effort to develop 3-dimensional coupled plasma and electromagnetic modeling
tools in recent years. In this work, we report on these modeling software
and their application to plasma processing system design and evaluation of
strategies for hardware and process improvement. Several of these examples
deal with process uniformity, which is one of the major challenges facing
plasma processing equipment design on large substrates. Three-dimensional
plasma modeling is used to understand the sources of plasma non-uniformity,
including the radio-frequency (RF) current path, and develop uniformity
improvement techniques. Examples from coupled equipment and process models
to investigate the dynamics of pulsed plasmas and their impact on plasma
chemistry will also be discussed.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2013.DPP.VI3.3