Bulletin of the American Physical Society
71st Annual Meeting of the APS Division of Fluid Dynamics
Volume 63, Number 13
Sunday–Tuesday, November 18–20, 2018; Atlanta, Georgia
Session E13: Particle-Laden Drops
5:10 PM–6:15 PM,
Sunday, November 18, 2018
Georgia World Congress Center
Room: B218
Chair: Alvaro Marin, University of Twente
Abstract ID: BAPS.2018.DFD.E13.1
Abstract: E13.00001 : Uncoupling evaporation kinetics and particle depositions of sessile suspension droplets on soft substrates*
5:10 PM–5:23 PM
Presenter:
Yuhong Chen
(University of Edinburgh)
Authors:
Yuhong Chen
(University of Edinburgh)
Alexandros Askounis
(Kyushu University)
Yasuyuki Takata
(Kyushu University, Kyushu University)
Prashant Valluri
(University of Edinburgh)
Vasileios Koutsos
(University of Edinburgh)
Khellil Sefiane
(University of Edinburgh)
In present work, the evaporation of water droplets containing 0.125wt% SiO2 nanoparticles on PDMS surface were recorded by a CCD camera and then the particle depositions left were imaged by a laser scanning confocal microscope. The PDMS was fabricated with various curing ratios of monomer to cross-linker, n=10:1∼160:1. It is found that when n<60:1, the droplet evaporation starts with constant contact radius (CCR) mode, followed by constant contact angle (CCA) mode and then mixed mode, and finally end up with a short CCR mode.The “coffee-ring” pattern is left behind with cracks and deposition tail. Whereas, when n≥60:1 the dying droplet spread first and its duration decreases with softness of substrate. Then the evaporation kinetics is dominated by CCR mode almost till the end of the evaporation at n=60:1 and 80:1 while mixed mode at n≥100:1. As for particle deposition, at n=60:1 and 80:1 a continuous annular deposition pattern is formed with a lateral section of sharp ox horn. When n≥100:1 there is residue dimple after droplet evaporation due to the plastic deformation of substrates. The particles would precipitate on this dimple and the finger instability at the outer edge of the deposition is visible.
*EC-H2020-RISE-ThermaSMART-778104 and CSC
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.DFD.E13.1
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