Bulletin of the American Physical Society
71st Annual Meeting of the APS Division of Fluid Dynamics
Volume 63, Number 13
Sunday–Tuesday, November 18–20, 2018; Atlanta, Georgia
Session E06: Electrokinetics: Ion-Selective Interfaces
5:10 PM–6:28 PM,
Sunday, November 18, 2018
Georgia World Congress Center
Room: B208
Chair: Sung Jae Kim, Seoul National University
Abstract ID: BAPS.2018.DFD.E06.3
Abstract: E06.00003 : Non-negligible transient effect on perm-selective ion transportation*
5:36 PM–5:49 PM
Authors:
Soonhyun Kwon
(Department of Electrical and Computer Engineering, Seoul National University)
Hyomin Lee
(Department of chemical and biological engineering, Jeju National University)
Sung Jae Kim
(Department of Electrical and Computer Engineering, Seoul National University)
Perm-selective ion transportation has been extensively utilized in various micro/nanofluidic applications. While a steady state assumption was typically adopted to characterize the device, here we experimentally demonstrated that there is inevitable transient effect on the perm-selective ion transportation, especially low Reynolds number environment. The voltage/current (V-C) measurement in micro/nanofluidic platform often showed that current were bumped up in limiting current regime (i.e. overshoot) unlike theoretical results of steady state assumption. In this work, we measured V-C in dead-end channel connected by side channel. Buffer liquid was continuously injected from the side channel so that a constant electrolyte concentration was kept from the side channel to reservoir. Extending the distance from membrane to the side channel resulted in more severe overshoot effect, meaning there is non-negligible transient effect on the ion transportation through membrane. Conclusively, this transient effect should be considered in designing energy-related micro/nanofluidic application.
*Basic Research Laboratory Project (NRF-2018R1A4A1022513) by the Ministry of Science and ICT, Korea, BK21 plus program in SNU, LG Yonam Foundation of Korea and scholarship from Samsung electronics.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.DFD.E06.3
Follow Us |
Engage
Become an APS Member |
My APS
Renew Membership |
Information for |
About APSThe American Physical Society (APS) is a non-profit membership organization working to advance the knowledge of physics. |
© 2023 American Physical Society
| All rights reserved | Terms of Use
| Contact Us
Headquarters
1 Physics Ellipse, College Park, MD 20740-3844
(301) 209-3200
Editorial Office
1 Research Road, Ridge, NY 11961-2701
(631) 591-4000
Office of Public Affairs
529 14th St NW, Suite 1050, Washington, D.C. 20045-2001
(202) 662-8700