Bulletin of the American Physical Society
47th Annual Meeting of the APS Division of Atomic, Molecular and Optical Physics
Volume 61, Number 8
Monday–Friday, May 23–27, 2016; Providence, Rhode Island
Session K1: Poster Session II (4:00pm-6:00pm)
4:00 PM,
Wednesday, May 25, 2016
Room: Exhibit Hall C
Abstract ID: BAPS.2016.DAMOP.K1.190
Abstract: K1.00190 : Second generation measurement of the electric dipole moment of the electron using trapped ThF$^+$ ions
Preview Abstract Abstract
Authors:
Kia Boon Ng
(JILA, NIST and University of Colorado, and Department of Physics, University of Colorado, Boulder CO 80309-0440, USA)
Yan Zhou
(JILA, NIST and University of Colorado, and Department of Physics, University of Colorado, Boulder CO 80309-0440, USA)
Daniel Gresh
(JILA, NIST and University of Colorado, and Department of Physics, University of Colorado, Boulder CO 80309-0440, USA)
William Cairncross
(JILA, NIST and University of Colorado, and Department of Physics, University of Colorado, Boulder CO 80309-0440, USA)
Matthew Grau
(JILA, NIST and University of Colorado, and Department of Physics, University of Colorado, Boulder CO 80309-0440, USA)
Yiqi Ni
(JILA, NIST and University of Colorado, and Department of Physics, University of Colorado, Boulder CO 80309-0440, USA)
Jun Ye
(JILA, NIST and University of Colorado, and Department of Physics, University of Colorado, Boulder CO 80309-0440, USA)
Eric Cornell
(JILA, NIST and University of Colorado, and Department of Physics, University of Colorado, Boulder CO 80309-0440, USA)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2016.DAMOP.K1.190
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