Bulletin of the American Physical Society
2013 Joint Meeting of the APS Division of Atomic, Molecular & Optical Physics and the CAP Division of Atomic, Molecular & Optical Physics, Canada
Volume 58, Number 6
Monday–Friday, June 3–7, 2013; Quebec City, Canada
Session B6: Precision Measurements: Techniques and Applications
10:30 AM–12:30 PM,
Tuesday, June 4, 2013
Room: 302
Chair: Derek Kimball, California State University East Bay
Abstract ID: BAPS.2013.DAMOP.B6.2
Abstract: B6.00002 : Multi-channel Chip-Scale Atomic Magnetometry
10:42 AM–10:54 AM
Preview Abstract Abstract
Authors:
Orang Alem
(National Institute of Standards and Technology, Boulder CO, USA)
Tilmann H. Sander
(Physikalisch-Technische Bundesanstalt, Berlin, Germany)
John J. Le Blanc
(Charles Stark Draper Laboratory, Inc., Cambridge MA, USA)
Rahul Mhaskar
(National Institute of Standards and Technology, Boulder CO, USA)
John Kitching
(National Institute of Standards and Technology, Boulder CO, USA)
Lutz Trahms
(Physikalisch-Technische Bundesanstalt, Berlin, Germany)
Svenja Knappe
(National Institute of Standards and Technology, Boulder CO, USA)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2013.DAMOP.B6.2
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