Bulletin of the American Physical Society
APS April Meeting 2022
Volume 67, Number 6
Saturday–Tuesday, April 9–12, 2022; New York
Session S12: Instrumentation II
1:30 PM–3:06 PM,
Monday, April 11, 2022
Room: Shubert
Sponsoring
Unit:
DNP
Chair: Fred Wietfeldt, Tulane University
Abstract: S12.00006 : Charged Particle Detection with Thermal Kinetic Inductance Detectors*
2:30 PM–2:42 PM
Presenter:
Elizabeth M Scott
(National Institute of Standards and Technology)
Authors:
Elizabeth M Scott
(National Institute of Standards and Technology)
Hans P Mumm
(National Institute of Standards and Technology)
Jiansong Gao
(National Institute of Standards and Technology, Boulder)
Joel N Ullom
(National Institute of Standards and Technology Boulder)
Jimmy Caylor
(University of Tennessee)
Colin A Heikes
(University of Maryland, College Park)
Shannon M Hoogerheide
(National Institute of Standards and Technology)
Maynard Dewey
(National Institute of Standards and Technology)
Jeffrey S Nico
(National Institute of Standards and Technology)
Michael R Vissers
(National Institute of Standards and Technology, Boulder)
We are working to achieve this by adapting Thermal Kinetic Inductance Detectors (TKIDs) for external charged particle detection. These cryogenic detectors are used in X-ray and gamma spectroscopy as well as dark matter searches and have been shown to have photon energy resolutions on the order of tens of eV. They can be multiplexed to create large area detectors. Thus far, however, TKIDs have not yet been developed for external (non-embedded) charged particle detection. Creating a TKID with a sensitivity of 100s of eV or better for such sources of could significantly impact the next generation of nuclear experiments. This talk will cover the initial prototype design and characterization and the results from X-ray measurements.
* We gratefully acknowledge support from the U.S. Department of Energy, Office ofNuclear Physics, under grant DE-SC0021415 and Interagency Agreement No. 89243019SSC000025, and NIST (U.S. Department of Commerce).
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