Bulletin of the American Physical Society
2018 Annual Meeting of the APS Four Corners Section
Volume 63, Number 16
Friday–Saturday, October 12–13, 2018; University of Utah, Salt Lake City, Utah
Session C05: AMO1: Optical Measurement
10:45 AM–11:57 AM,
Friday, October 12, 2018
CSC
Room: 208
Chair: Arvinder Sandhu, University of Arizona
Abstract ID: BAPS.2018.4CS.C05.3
Abstract: C05.00003 : Optical Characterization of Zinc Oxide Thin Film Semiconductors*
11:21 AM–11:33 AM
Presenter:
James W Erikson
(Brigham Young University)
Authors:
James W Erikson
(Brigham Young University)
John S Colton
(Brigham Young Univ - Provo)
Zinc oxide is a wide band gap semiconductor with many potential applications, including ultraviolet lasers, transparent circuits, and radiation resistant devices. In order to create these devices, both n- and p- type materials are required, however reliable methods of p-type doping of zinc oxide have yet to be developed. We have attempted to grow arsenic doped zinc oxide films using RF magnetron sputtering. Sample quality and doping are studied with stimulated photoluminescence, which has been found to improve with As doping and annealing processes. This in turn allows us to further refine our film growth process in the hopes of creating consistently p-type material.
*Thanks to the BYU Department of Physics and Astronomy for their support of my work.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.4CS.C05.3
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