Bulletin of the American Physical Society
2023 APS March Meeting
Volume 68, Number 3
Las Vegas, Nevada (March 5-10)
Virtual (March 20-22); Time Zone: Pacific Time
Session Q42: 2D Materials: Advanced Characterization IV
3:00 PM–5:24 PM,
Wednesday, March 8, 2023
Room: Room 318
Sponsoring
Unit:
DMP
Chair: Christopher Smallwood, San Jose State University
Abstract: Q42.00007 : Real-time In-situ Electrostatic Alignment for Micro and Nano ARPES: First results
4:36 PM–4:48 PM
Presenter:
Timo Wätjen
(Scienta Omicron)
Authors:
Daniel A Beaton
(Scienta Omicron Inc.)
Craig Polley
(MAX IV Labratory)
Timo Wätjen
(Scienta Omicron)
Marcus Lundwall
(Scienta Omicron)
Khadiza Ali
(MAX IV Labratory)
Patrik Karlsson
(Scienta Omicron)
Generally ARPES measurements require time consuming, iterative alignment of sample position and light source to match the photoelectron emission spot with the analyzer focal point. Without optimized alignment operation of the analyzer measurement data quality may be compromised. The Electrostatic 3D Focus adjustment technology allows users to generate dynamic lens tables in real time in order to achieve fully optimized deflection, angular and/or transmission modes for data collection. These live lens tables enable calibrated and continuous electronic shifting of the analyzer focal point in three dimensions. This technology represents a major advancement for micro- and nano-ARPES.
As part of our presentation, we will discuss how the alignment of focal point and emission spot is a general ARPES issue, but is particularly important for micro/nanoARPES application as misalignment effects scale with smaller spot sizes and photoelectron kinetic energy. ARPES spectra of graphene measured at the Bloch beamline at MAX IV will be shown as a model case and used as an example to demonstrate the significant impact of the Electrostatic 3D Focus Adjustment on data quality.
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