High-speed X-ray Phase Contrast Imaging Analysis of Microscale Shock Response of a Mock Additively Manufactured Energetic Material*

X-ray phase contrast imaging (XPCI) is used to probe the interior of a mock additively manufactured energetic material (AMEM) under dynamic loading and determine the equation of state (EOS). AMEMs have a range of structural characteristics with a hierarchy of length scales and process-inherent heterogeneities. Many of these features are difficult to precisely control or avoid and it is important to understand how they affect the dynamic response of the AMEM. To this effect, XPCI is a technique that grants insight into micro- and meso- scale processes during a shock event. We use XPCI results to analyze the shock response of a mock AMEM loaded in different directions at several impact conditions. By tracking displacement of the shock front and features behind it, we can determine shock velocity and particle velocity. PDV was also used to measure the free surface velocity of the specimens and from that the particle velocities, which correlate well with those obtained from XPCI. The shock and particle velocity EOS is found to approximately follow U_s = 1.63U_p+ 2619 with R² = 0.8. The experiments presented were performed at the DCS in the APS at Argonne National Lab, in collaboration with Brian Jensen at Los Alamos National Lab.