Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session F49: Superconducting Proximity Effect and Josephson Junctions II
8:00 AM–11:00 AM,
Tuesday, March 3, 2020
Room: Mile High Ballroom 1B
Sponsoring
Unit:
DCMP
Chair: John Wei, University of Toronto
Abstract: F49.00004 : THz emission peak at low voltage bias from stacked intrinsic Josephson junction Bi2Sr2CaCu2O8 terahertz sources*
Presenter:
Karen J Kihlstrom
(Physics, Queens College CUNY)
Authors:
Karen J Kihlstrom
(Physics, Queens College CUNY)
Timothy Benseman
(Physics, Queens College CUNY)
Alexei Koshelev
(Materials Science Division, Argonne National Laboratory)
Ulrich Welp
(Materials Science Division, Argonne National Laboratory)
Wai-Kwong Kwok
(Materials Science Division, Argonne National Laboratory)
Kazuo Kadowaki
(Institute for Materials Science, University of Tsukuba)
THz emission from these devices has previously been typically observed at frequencies between around 0.4 THz – 2 THz, corresponding to Josephson voltages of between 0.8 mV and 4 mV per intrinsic junction. However, we have recently observed a new type of emission which occurs at bias currents below the retrapping current of the stacked Josephson junctions. This unusual THz emission state is highly reproducible, is metastable over a timescale of hours, and shows systematic temperature dependence. The maximum emitted THz power that can be generated from this mode is comparable to that generated by the more well-established and better-understood THz emission modes in Bi2Sr2CaCu2O8 mesa sources.
We will discuss possible mechanisms for the unusual emission mode, together with future directions of related research.
*This research is supported by PSC-CUNY Award 60792-00-48; and by the US Department of Energy, Office of Sciences, Materials Sciences and Engineering Division.
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