Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session F33: Morphology Characterization: Resonant X-ray Scattering
8:00 AM–11:00 AM,
Tuesday, March 3, 2020
Room: 505
Sponsoring
Unit:
DPOLY
Chair: Cheng Wang, Lawrence Berkeley National Laboratory
Abstract: F33.00008 : Polarized resonant soft X-ray scattering reveals local chain orientation in polymer-grafted nanoparticles
Presenter:
Subhrangsu Mukherjee
(National Institute of Standards and Technology)
Authors:
Subhrangsu Mukherjee
(National Institute of Standards and Technology)
Jason Streit
(Air Force Research Laboratory)
Richard Arthur Vaia
(Air Force Research Laboratory)
Dean DeLongchamp
(National Institute of Standards and Technology)
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