12-ID – Soft Matter Interfaces (SMI) – A new resonant tender x-rays scattering Beamline at NSLS II*

X-ray scattering is a powerful tool to study the structure and dynamics of soft matter on length scales from nanometers to millimeters and time scales from picoseconds to seconds. In the presentation, I will give a brief overview of the scattering techniques and instruments available at the new, high-brightness, NSLS-II synchrotron to study soft and biomaterials and then present the detailed design, parameters and the status of the Soft Matter Interfaces (SMI) beamline. SMI beamline capabilities on the tender x-ray regime will be highlighted since it enables resonant x-ray scattering measurements at the K-edges of key elements to bring new perspectives to the soft matter community: such as the P, Cl for water membrane problematics: Sulfur edge for organo-electronic filed; as well as K, Ca and more edges. The second part of the presentation will focus on a broad overview of the first results obtained at the beamline on a wide range of material, from organo-photovoltaic polymer to liquid membranes. Finally, the development of new in-situ stages, such as heating, shearing opens a wide field of possibilities.