Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session P45: Complex Oxide Surfaces, Interfaces, and Thin Films II
2:30 PM–5:30 PM,
Wednesday, March 6, 2019
BCEC
Room: 211
Sponsoring
Unit:
DCMP
Chair: Mohammad Saghayezhian, Louisiana State University
Abstract: P45.00015 : Effect of perovskite dielectric BaxSr1-xHfO3 on BaSnO3
5:18 PM–5:30 PM
Presenter:
HYEONGMIN CHO
(Seoul National University)
Authors:
HYEONGMIN CHO
(Seoul National University)
Young Mo Kim
(Seoul National University)
Kookrin Char
(Seoul National University)
To prevent the change of channel conductance by such photoconductivity of the BSO buffer layer, we fabricated an atomically-mixed BaxSr1-xHfO3 (BSHO) buffer layer. Both BaHfO3 (BHO) and SrHfO3 (SHO) have wider bandgaps than BSO (5.8 eV and 6.1 eV respectively) and show no measurable photoconductivity. Also, BHO is a high-k dielectric material with a dielectric constant of 38. We reduced BSHO lattice mismatch with BLSO by finding a suitable ratio of BHO to SHO. We will report on the field effect transistor performances with BSHO as a buffer layer on BLSO channel layer as well as a gate dielectric.
[1] H. J. Kim, U. Kim et al., Appl. Phys. Express 5, 061102 (2012).
[2] U. Kim et al., APL Mater. 4, 071102 (2016).
[3] Juyeon Shin et al., Appl. Phys. Lett. 109, 262102 (2016).
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