Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session H26: Advances in Scanned Probe Microscopy II: High Frequency, and Optical and Low Temperature Measurements
2:30 PM–5:06 PM,
Tuesday, March 5, 2019
BCEC
Room: 160B
Sponsoring
Unit:
GIMS
Abstract: H26.00005 : Upgrading a low-temperature scanning tunneling microscope for electron spin resonance experiments*
3:42 PM–3:54 PM
Presenter:
Fabian Natterer
(University of Zurich)
Authors:
Fabian Natterer
(University of Zurich)
François Patthey
(Ecole polytechnique federale de Lausanne)
Tobias Bilgeri
(Ecole polytechnique federale de Lausanne)
Patrick Forrester
(Ecole polytechnique federale de Lausanne)
Nicolas Weiss
(Ecole polytechnique federale de Lausanne)
Harald Brune
(Ecole polytechnique federale de Lausanne)
[1] Natterer et al., arXiv:1810.03887 (2018)
[2] Yang et al., PRL 119, 227206 (2017)
*Support from the Swiss National Science Foundation under project numbers PZ00P2_167965 and 200020_176932 is appreciated.
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