High temperature RIXS study of charge transfer excitations in cuprates*

Resonant inelastic X-ray scattering (RIXS) is a promising technique to study momentum-resolved electronic excitations in strongly correlated materials. Here we present results of a recent Cu K-edge RIXS study on the archetypal hole-doped cuprate La_2-xSr_xCuO₄ and electron-doped cuprate Nd_2-xCe_xCuO₄. Our measurements, which range from low temperature (15 K) to very high temperature (1200 K), indicate distinct spectral weight changes of charge-transfer excitations below ~ 2 eV. We will make a detailed comparison of the temperature dependent charge-transfer excitations in electron- and hole- doped cuprates.