Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session C45: Oxide Surfaces and Defects
2:30 PM–5:30 PM,
Monday, March 4, 2019
BCEC
Room: 211
Sponsoring
Unit:
DCMP
Chair: Christopher Homes, Brookhaven National Laboratory
Abstract: C45.00011 : Cryogenic force microscopy of Sketched LaAlO3/SrTiO3 Nanostructures*
4:30 PM–4:42 PM
Presenter:
Joseph Albro
(Physics and Astronomy, University of Pittsburgh)
Authors:
Joseph Albro
(Physics and Astronomy, University of Pittsburgh)
Jessica H Montone
(Physics and Astronomy, University of Pittsburgh)
Feng Bi
(Physics and Astronomy, University of Pittsburgh)
Mengchen Huang
(Physics and Astronomy, University of Pittsburgh)
Jung-Woo Lee
(Materials Science and Engineering, University of Wisconsin-Madison)
Hyungwoo Lee
(Materials Science and Engineering, University of Wisconsin-Madison)
Chang-Beom Eom
(Materials Science and Engineering, University of Wisconsin-Madison)
Patrick Irvin
(Physics and Astronomy, University of Pittsburgh)
Jeremy Levy
(Physics and Astronomy, University of Pittsburgh)
Local probes can provide insight into the electronic properties of 2D oxide interfaces (in particular, LaAlO3/SrTiO3) that are hard to determine using bulk transport methods. Scanning SQUID microscopy has revealed enhanced transport along ferroelastic domain boundaries [1]. Recently, Frenkel et al showed [2] that local pressure applied to the LAO/STO interface can reveal enhanced transport along ferroelastic domain boundaries. We are interested in resolving electron transport in LaAlO3/SrTiO3 nanostructures that are “sketched” [3] using conductive-AFM lithography. We describe experiments performed both at room temperature and at low temperatures (<25 K) using a modified vacuum AFM.
[1] B. Kalisky et al., Nature Materials 12, 1091 (2013).
[2] Y. Frenkel et al., Nature Materials 16, 1203 (2017).
[3] C. Cen et al., Nature Materials 7, 298 (2008).
*JL acknowledges a Vannevar Bush Faculty Fellowship, funded by ONR (N00014-15-1-2847). C-BE acknowledges support from NSF DMREF (DMR-1629270), AFOSR (FA9550-15-1-0334), and AOARD (FA2386-15-1-4046).
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