Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session B11: Defects in Semiconductors -- Device Materials
11:15 AM–2:03 PM,
Monday, March 4, 2019
BCEC
Room: 152
Sponsoring
Units:
DMP DCOMP FIAP
Chair: Hartwin Peelaers, University of Kansas
Abstract: B11.00003 : The Near-Surface Electrostatic Environment of n-Doped Silicon Probed with a Moveable Dangling Bond Point Probe
12:03 PM–12:15 PM
Presenter:
Taleana Huff
(Physics, University of Alberta)
Authors:
Taleana Huff
(Physics, University of Alberta)
Thomas Dienel
(Physics, University of Alberta)
Mohammad Rashidi
(Physics, University of Alberta)
Roshan Achal
(Physics, University of Alberta)
wyatt vine
(Physics, University of Alberta)
Robert A Wolkow
(Physics, University of Alberta)
[1] T. Huff, H. et al. In Review at Nature Electronics. arXiv:1706.07427v3 (2017)
[2] Hollenberg, L. C. L. et al. Phys. Rev. B 69, 113301 (2004)
[3] Baris, B. et al. ACS Nano 6, 6905–6911 (2012)
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